| 1. Identity statement | |
| Reference Type | Journal Article |
| Site | mtc-m16.sid.inpe.br |
| Holder Code | isadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S |
| Identifier | 6qtX3pFwXQZsFDuKxG/FrVvp |
| Repository | sid.inpe.br/marciana/2005/03.14.09.55 |
| Last Update | 2008:03.14.18.36.28 (UTC) administrator |
| Metadata Repository | sid.inpe.br/marciana/2005/03.14.09.55.10 |
| Metadata Last Update | 2018:06.05.01.28.50 (UTC) administrator |
| Secondary Key | INPE-12267-PRE/7593 |
| ISSN | 0185-1101 |
| Citation Key | HolyKubAbrPesKop:1993:XrDiSm |
| Title | X-ray diffractometry of small defects in layered systems  |
| Project | TECMAT: Tecnologia de materiais |
| Year | 1993 |
| Month | Apr. |
| Access Date | 2024, May 18 |
| Secondary Type | PRE PI |
| Number of Files | 1 |
| Size | 340 KiB |
| 2. Context | |
| Author | 1 Holy, V. 2 Kubena, J. 3 Abramof, Eduardo 4 Pesek, A. 5 Koppensteiner, E. |
| Resume Identifier | 1 2 3 8JMKD3MGP5W/3C9JGUH |
| Group | 1 2 3 LAS-INPE-MCT-BR |
| Affiliation | 1 Masaryk University, Faculty of Science, Department of Solid State Physics 2 Masary University, Faculty of Science, Department of Solid State Physics 3 Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais, (INPE. LAS) 4 Johannes Kepler University, Institute of Experimental Physics 5 Johannes Kepler University, Institute of Semiconductor Physics |
| Journal | Revista Mexicana de Astronomía y Astrofísica |
| Volume | 26 |
| Number | 4A |
| Pages | A146-A150 |
| History (UTC) | 2005-03-14 12:55:12 :: sergio -> administrator :: 2007-04-03 21:52:05 :: administrator -> sergio :: 2008-01-07 12:50:07 :: sergio -> marciana :: 2008-03-14 18:36:28 :: marciana -> administrator :: 2008-06-10 22:05:25 :: administrator -> banon :: 2010-05-12 16:45:36 :: banon -> administrator :: 2018-06-05 01:28:50 :: administrator -> marciana :: 1993 |
| 3. Content and structure | |
| Is the master or a copy? | is the master |
| Content Stage | completed |
| Transferable | 1 |
| Content Type | External Contribution |
| Keywords | SENSORS AND MATERIALS X-ray diffraction Diffraction Crystals SENSORES E MATERIAIS Difração de raio-x Difração Cristais |
| Abstract | X-ray diffraction in thin layers and layered systems is described using the optical coherence approach and the semi-kinematical diffraction theory. Two defect models in thin layers are considered-the mosaic structure model and the model of interface roughness. For both defect models the reflection curves of a thin layer and a superlattice have been calculated and compared with double-crystal X-ray diffractometry results on superlattices and epitaxial layers. The distribution of the diffusely scattered intensity near a reciprocal lattice point has been calculated theoretically for both models and it has been proved experimentally by double- and triple-crystal diffractometry of epitaxial layers with mosaic structure. It has been demonstrated that the theory yields a tool for estimating the predominant defect type in a layered structure. |
| Area | FISMAT |
| Arrangement | urlib.net > Produção anterior à 2021 > LABAS > X-ray diffractometry of... |
| doc Directory Content | access |
| source Directory Content | there are no files |
| agreement Directory Content | there are no files |
| 4. Conditions of access and use | |
| data URL | http://urlib.net/ibi/6qtX3pFwXQZsFDuKxG/FrVvp |
| zipped data URL | http://urlib.net/zip/6qtX3pFwXQZsFDuKxG/FrVvp |
| Language | en |
| Target File | x ray.pdf |
| User Group | administrator banon marciana sergio |
| Visibility | shown |
| Copy Holder | SID/SCD |
| Archiving Policy | allowpublisher allowfinaldraft |
| Read Permission | allow from all |
| 5. Allied materials | |
| Next Higher Units | 8JMKD3MGPCW/3ESR3H2 |
| Citing Item List | sid.inpe.br/mtc-m21/2012/07.13.14.44.57 1 |
| Dissemination | PORTALCAPES; SCIELO. |
| Host Collection | sid.inpe.br/banon/2003/08.15.17.40 |
| 6. Notes | |
| Empty Fields | alternatejournal archivist callnumber copyright creatorhistory descriptionlevel documentstage doi e-mailaddress electronicmailaddress format isbn label lineage mark mirrorrepository nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress readergroup rightsholder schedulinginformation secondarydate secondarymark session shorttitle sponsor subject tertiarymark tertiarytype typeofwork url versiontype |
| 7. Description control | |
| e-Mail (login) | marciana |
| update | |